Description

NEXTIN, Inc., established in 2010 and based in Hwaseong-si, South Korea, develops and manufactures advanced systems for defect inspection and precision measurement, catering to the semiconductor and display sectors. Its product portfolio features AEGIS wafer inspection systems, which effectively pinpoint various flaws such as bridges, thinning, protrusions, footing issues, scratches, and particulate contamination throughout essential semiconductor manufacturing steps like film deposition, pattern creation, planarization, ion implantation, and cleaning. The company also provides IRIS, a sophisticated wafer metrology-inspection system designed to accurately gauge vertical structures and uncover pattern defects during High Aspect Ratio (HAR) processes in 3D semiconductor devices and Through-Silicon Via (TSV) processing for advanced 3D packaging. Additionally, NEXTIN offers TWINS, an integration module engineered to be installed directly onto process equipment, enabling the measurement of edge trimming operations and the inspection of related process defects.