Description

Tera Probe, Inc. is an international company specializing in semiconductor testing, encompassing initial wafer evaluation, final product verification, and comprehensive test engineering services. The firm provides extensive testing and related support for a wide array of semiconductor devices, including DRAM, Systems-on-Chip (SoC), CPUs, image sensors, and analog components. Additionally, it facilitates debugging by offering cross-platform conversion for test programs and adapting test patterns to ensure compatibility with diverse testing equipment. Tera Probe also manages the entire lifecycle of probe cards, from their design and development to mass production, alongside offering meticulous evaluation and parallelism testing services for these critical components. Established in 2005 and headquartered in Yokohama, Japan, Tera Probe, Inc. operates as a subsidiary of Powertech Technology Inc.