Tera Probe, Inc. (6627.T) JPX

10,890.00

-90(-0.82%)

Updated at June 03 03:24PM

Currency In JPY

Tera Probe, Inc.

Address

KAKiYA Building

Yokohama,

Japan

Phone

81 45 476 1011

Sector

Technology

Industry

Semiconductors

Employees

1042

First IPO Date

December 16, 2010

Key Executives

NameTitlePayYear Born
Yoichi KurokiStatutory Executive Officer & Director01970
Takayuki IkeuchiExecutive Officer01967
Tsuyoshi YokoyamaPresident, Representative Statutory Executive Officer & Chairman01966
Minari IkedaExecutive Officer01967
Masayuki NakagawaExecutive Officer & Chief Financial Officer01967
Hiroaki HaradaExecutive Officer & Kyushu Business Office Director01969

Description

Tera Probe, Inc. engages in wafer testing, final testing, and test engineering business in Japan and internationally. The company provides testing and test related services for various semiconductor devices, including DRAM, SoC, CPU, image sensors, and analog devices; and test program cross-platform conversion services for debugging, as well as test patterns conversion services to work with testers. It also offers design and development support services, and mass production for various probe cards; and provides card evaluation and parallelism testing services. The company was founded in 2005 and is headquartered in Yokohama, Japan. Tera Probe, Inc. is a subsidiary of Powertech Technology Inc.